Volume : 4, Issue : 10, October - 2015

Effect of Annealing Temperature on Microstructure amd Surface Morphology (AFM) of ZnO Thin Films with Mg Dopant

Dr. Mahendra Kumar

Abstract :

<p>The morphological properties of the thin films were studied with the help of atomic force microscopy (AFM) technique. The films were subsequently annealed in ambient air from 400&deg;C to 500&deg;C. The average grain size ranged from 15 to 27nm. Increasing annealing temperatures resulted in larger grain sizes and higher crystallinity, with the surface roughness of annealed films being more than twice if compared to unannealed film.</p>

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Dr. Mahendra Kumar Effect of Annealing Temperature on Microstructure amd Surface Morphology (AFM) of ZnO thin films with Mg dopant Global Journal For Research Analysis, Vol: 4, Issue: 10 October 2015


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