Volume : 6, Issue : 5, May - 2017

INFLUENCE OF POST DEPOSITION ANNEALING ON THE OPTICAL AND STRUCTURAL PROPERTIES OF ZINC-TETRA-TERT-BUTYL PHTHALOCYANINE THIN FILMS

B R Rejitha, C S Menon

Abstract :

<p>&nbsp;<span style="font-size: 11pt; text-align: justify;">Zinc-tera-tert-butylphthalocyanine (Zinc2, 9, 16, 23-tetra-tert-butyl-29H, 31H-phthalocyanine) (ZnTTBPc) is a new material in phthalocyanine family. Its molecular formula is C</span><sub style="text-align: justify;">48</sub><span style="font-size: 11pt; text-align: justify;">H</span><sub style="text-align: justify;">48</sub><span style="font-size: 11pt; text-align: justify;">N</span><sub style="text-align: justify;">8</sub><span style="font-size: 11pt; text-align: justify;">Zn. Phthalocyanines are organic semiconductors; ZnTTBPc in the powder form is used as the source material. Thin films of ZnTTBPc are deposited onto precleaned glass substrates kept at room temperature using a Hind Hivac vacuum coating unit. The thickness of the films is cross checked by Tolansky&rsquo;s multiple beam interference technique. Films of equal thickness prepared at room temperature are annealed in air by keeping them in a furnace fitted with a temperature-controller cum recorder for one hour. The UV-VIS-NIR spectra of these samples are recorded. The optical studies are carried out by analyzing the absorption and reflection spectra. Graphs are</span><span style="font-size: 11pt; text-align: justify;">&nbsp;&nbsp; </span><span style="font-size: 11pt; text-align: justify;">plotted &alpha;</span><sup style="text-align: justify;">2</sup><span style="font-size: 11pt; text-align: justify;"> against photon energy .From this band gap energy of ZnTTBPc thin films are calculated. The </span><span style="font-size: 11pt; text-align: justify;">&nbsp;</span><span style="font-size: 11pt; text-align: justify;">surface morphology of the films deposited on glass substrate of as deposited and annealed samples are studied using </span><span style="font-size: 11pt; text-align: justify;">&nbsp;</span><span style="font-size: 11pt; text-align: justify;">Scanning Electron Micrographs (SEM), which show that there is a change in surface morphology</span><span style="font-size: 11pt; text-align: justify;">&nbsp;&nbsp; </span><span style="font-size: 11pt; text-align: justify;">of the film due to annealing.&nbsp;</span></p> <p class="MsoNormal" style="margin-left:-.25in;text-align:justify;line-height:&#10;200%"><span style="font-size:11.0pt;line-height:200%"><o:p></o:p></span></p>