Volume : 6, Issue : 2, February - 2017

Comparison of X-Ray Switching Studies on Pure, Doped and Composites of CdI2

Meena Kumari, Kulvinder Singh, Abhijit Nayak

Abstract :

<p>&nbsp;<span style="font-size:9.0pt;font-family:&quot;Times New Roman&quot;,serif;&#10;mso-fareast-font-family:&quot;Times New Roman&quot;;mso-fareast-theme-font:minor-fareast;&#10;letter-spacing:-.1pt;mso-ansi-language:EN-US;mso-fareast-language:EN-US;&#10;mso-bidi-language:AR-SA">X-ray detectors are most important component of any digital imaging system which requires good spatial resolution, low radiation and digital storage of data. In present days mostly charge-coupled devices (CCD) or complementary metal oxide semiconductor (CMOS) are used in imaging devices. In order to determine the response time of the detector at room temperature, we performed the switching studies on CdI₂ composites, pure and doped cadmium iodide.</span></p>